Disk Chipping Inspection Device DSiS-2015
Detecting chipping, dirt, etc. on glass substrates, media surfaces, and edge areas with high speed and high precision.
This is a mass production line inspection device that detects glass substrates, media surfaces, edge chipping, dirt, etc., with high speed and high precision through image analysis captured by a CCD camera. It can automatically sort disks based on pass/fail judgments, and the inspection results can be communicated to and managed by a higher-level system. - Throughput: up to 800 PPH (depending on inspection conditions) - Footprint: Main body: (W) 1380 × (D) 1700 × (H) 2100 mm (W) 1810: including cassette transfer section PC rack: (W) 570 × (D) 630 × (H) 1850 mm - Cleanliness: Class 10 (at 0.1μm) - Compatible with automatic transport systems Inspection specifications: - Supported disks: 1.89”, 2.5”, 3.5” - Inspection area: entire area excluding the inner peripheral end face (or designated area) - Sensor element size: 7μm - Pixel resolution: inspection area (dependent on lens magnification) - Lens magnification: 1x to 3x (designed according to inspection content) - Design example: 2.5” disk, 800 PPH Inspection area: Inner circumference: R10.0 to R15.0 (2x) Outer circumference: R31.0 to R32.5 (3x)
- Company：クボタ計装
- Price：Other
